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Showing items 26-35 of 40 (4 Page(s) Totally)
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| 臺大學術典藏 |
2018-09-10T07:36:19Z |
Very-low-voltage testing of amorphous silicon TFT circuits
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Shen, S.-T.;Liu, W.-H.;Ma, E.-H.;Li, J.C.-M.;Cheng, I.-C.; Shen, S.-T.; Liu, W.-H.; Ma, E.-H.; Li, J.C.-M.; Cheng, I.-C.; I-CHUN CHENG |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Single stuck-at Faults and Multiple Timing Faults in Scan Chains
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Li, J. C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC
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Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T05:29:21Z |
Diagnosis of Multiple Hold-time and Setup-time Faults in Scan Chains
|
Li, J. C. M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T04:59:51Z |
A Design for Testability Technique for Low Power Delay Fault Testing
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Li, J. C. M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T04:15:41Z |
Diagnosis for Sequence Dependent Chips
|
Li, J. C.M.; E. J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Testing for Resistive and Stuck Opens
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Li, J. C.M.; Tseng, C.W.; E.J. McCluskey; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T03:50:57Z |
Diagnosis of Tunneling Opens
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Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI |
| 國立臺灣大學 |
2010 |
DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-in
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Kao, Wei-Chung; Chuang, Wei-Shun; Lin, Hsiu-Ting; Li, J.C.-M.; Manquinho, V. |
| 國立臺灣大學 |
2009 |
Time-space test response compaction and diagnosis based on BCH codes
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Wang, F.-M.; Wang, W.-C.; Li, J.C.-M. |
Showing items 26-35 of 40 (4 Page(s) Totally)
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